Nanoscale High-precision Profilometer
Nanoscale High-precision Profilometer
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Nanoscale High-precision Profilometer

Price
MOQ
$55000
1 Pieces
Product Details
Measurement Accuracy:
±0.005μm
Vertical Resolution:
0.001μm
Probe Type:
Diamond stylus (R=0.5μm)
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Product Description
Company Info

Basic Info

This nanoscale high-precision profilometer is designed for the nanoscale measurement needs of top precision manufacturing and research institutes. It adopts active vibration isolation and diamond micro-probe technology to achieve a vertical resolution of 0.001μm, and can accurately measure nanoscale surface roughness and step height parameters. It is suitable for scenarios such as semiconductor lithography masks, nano-coatings and MEMS devices, ensuring quality control accuracy in high-end manufacturing fields.

Key attributes

Measurement Accuracy
±0.005μm
Vertical Resolution
0.001μm
Probe Type
Diamond stylus (R=0.5μm)
Measuring Range
50mm×50mm×20mm
Interface
IEEE 1394, USB 3.1
Power Supply
220V 50/60Hz
Device Weight
25kg
Housing
Granite base + aluminum frame
Software
Professional 3D metrology software
Calibration
National standard calibration block
Environmental Shielding
Active vibration isolation
Operating Humidity
30%-60% RH
Measurement Accuracy
±0.005μm
Vertical Resolution
0.001μm
Probe Type
Diamond stylus (R=0.5μm)
Measuring Range
50mm×50mm×20mm
Interface
IEEE 1394, USB 3.1
Power Supply
220V 50/60Hz
Device Weight
25kg
Housing
Granite base + aluminum frame
Software
Professional 3D metrology software
Calibration
National standard calibration block
Environmental Shielding
Active vibration isolation
Operating Humidity
30%-60% RH

Customer reviews

David · Semiconductor Process Engineer
The Nanoscale High-precision Profilometer has exceeded our expectations for thin film measurement in our semiconductor fab. Its atomic-level resolution allows us to monitor deposition thickness with unprecedented accuracy. The automated data analysis features have streamlined our quality control process, reducing human error in critical measurements.

Product Description

Product features:

The core advantage lies in the active vibration isolation system that offsets the environmental vibration impact of the laboratory, paired with a 0.5μm radius diamond probe and 0.001μm vertical resolution to achieve nanoscale precision profile measurement. It uses a granite base and aluminum alloy frame to ensure structural stability, and is equipped with professional 3D metrology software to support 3D topography reconstruction and detailed geometric tolerance analysis. It supports IEEE1394 and USB3.1 high-speed data transmission, solving the industry pain points of accurate measurement of nanoscale workpieces, and fully meets the ISO 10110 international optical inspection standards to meet the needs of high-end scientific research and military-grade inspection.

https://globalsyt.oss-accelerate.aliyuncs.com/materials/192/0/20260314094727_69b4be2fe2fb1.jfif

Product specifications:

Detailed parameters: net weight 25kg, overall size 600mm×500mm×350mm; granite base ensures structural stability, active vibration isolation system eliminates environmental vibration interference within ±5μm; X/Y axis measurement stroke 50mm×50mm, Z axis stroke 20mm; measurement accuracy reaches ±0.005μm, vertical resolution 0.001μm; using R=0.5μm natural diamond test probe, supports nanoscale roughness, profile and step height detection; equipped with IEEE1394 and USB3.1 high-speed data interfaces, transmission speed up to 10Gbps; equipped with professional 3D metrology software, supports 3D topography visualization, GD&T geometric tolerance analysis and data comparison report generation; working environment requires temperature 20±0.5℃, relative humidity 30%-60% RH, need to use with stabilized power supply.

https://globalsyt.oss-accelerate.aliyuncs.com/materials/192/0/20260314094727_69b4be2fec5c3.webp

Product application:

Applicable to MEMS device 3D profile inspection, semiconductor lithography mask accuracy verification, nano-coating thickness measurement, optical lens nanoscale roughness inspection, military precision parts geometric tolerance inspection, university nanotechnology research experiments and other scenarios. As a laboratory-level high-precision inspection equipment, it provides accurate nanoscale measurement data for high-end manufacturing and research fields, helping enterprises control the production quality of top precision products and promote the research and development and optimization of nanoscale manufacturing processes.

Frequently Asked Questions (FAQ)

Q:How to choose between a portable profilometer and benchtop model?
A:Selection criteria: 1) Portable profilometers (2-5kg) suit field measurements with IP54 protection, 2) Benchtop models offer higher accuracy (0.01μm) for lab environments, 3) Consider measurement range (typically 1-1000μm) and required standards (ISO 4287/ASME B46.1 compliance).

Company Profile

Business Type:
Manufacturer
Main Products:
High temperature electric furnace,test chamber,,
Year of Establishment:
2019
Number of Employees:
Address:
Room 712-713, 7th Floor, Building B, No. 91 Hanjiang West Road, Xinbei District, Changzhou City, Changzhou, Jiangsu, China
Average Response Time:
Days

General Information

Business Type:
Manufacturer
Main Products:
High temperature electric furnace,test chamber,,
Year of Establishment:
2019
Number of Employees:
Management System Certification:
HACCP,QS9000,ISO9001,ISO17799,ISO16949,TS16969
Address:
Room 712-713, 7th Floor, Building B, No. 91 Hanjiang West Road, Xinbei District, Changzhou City, Changzhou, Jiangsu, China

Trade Capability

Main Markets:
北美,东欧,大洋洲,西欧,北欧
Shipping Ports:
Export Volume:
Average Lead Time:
Days
Payment Terms:
T/T L/C MoneyGram PayPal D/P Western Union Others
Cooperation Mode:
OEM ODM
Customization Supported:
Yes
Number of Foreign Trade Sales Staff:
Overseas Agent / Overseas Branch:
No

Company Show

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*To:
Mr. Yin Weiwei
Manager / Sales Department
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