Non-contact Laser Profilometer

Product features:

The core advantage is that non-contact measurement avoids probe wear and workpiece damage. The 650nm red laser and million-level sampling rate can achieve high-speed scanning of 12000 points/second, obtaining micron-level precision surface profile data. It is equipped with IP54 protection grade to adapt to workshop dust environment, supports Ethernet remote transmission of inspection data, and is compatible with mainstream reverse engineering and quality control analysis software. It solves the industry pain points of non-contact inspection for soft workpieces and ultra-thin workpieces, and supports batch workpiece rapid scanning to adapt to automated production line integration needs.

Product specifications:

Detailed parameters: using 650nm red safety laser, maximum scanning field of view 120°×80°; non-contact measurement accuracy ±0.1μm, X/Y axis measurement stroke 300mm×200mm, Z axis stroke 100mm; sampling rate reaches 1 million points/second, scanning speed 12000 points/second; overall size 450mm×350mm×250mm, net weight 8.5kg; supports 110/220V AC wide voltage power supply, equipped with Ethernet and USB3.0 data interfaces; compatible with professional inspection software such as AutoCAD and Geomagic Control, supports GD&T geometric tolerance analysis; protection grade IP54, can resist workshop dust and a small amount of splashing liquid; working temperature range 15-30℃, relative humidity 20%-80%.

Product application:

Applicable to semiconductor packaging profile inspection, flexible circuit board line accuracy verification, precision ceramic workpiece non-destructive testing, food packaging seal profile inspection, optical lens surface roughness measurement, 3C electronic parts appearance size inspection and other scenarios. It can be integrated into automated production lines for real-time online quality inspection, or used as an independent inspection equipment for batch sample analysis in the laboratory, helping enterprises avoid damage to precision workpieces caused by contact inspection, and improving inspection efficiency and data accuracy.