Laboratory Grade Roughness Profiler

Product features:

This laboratory-grade profiler uses a granite base to ensure excellent stability and reduce environmental vibration interference, with vertical resolution up to 0.0001μm, which can detect ultra-micro surface features. It is equipped with a motorized X/Y axis moving platform, supporting automatic multi-point detection and large-area contour scanning, meeting the needs of complex component testing. It supports replaceable diamond styluses with multiple tip radii (0.5μm, 1μm, 2μm, 5μm optional), adapting to different testing scenarios. The 15.6-inch 4K touch screen and professional analysis software can carry out in-depth analysis of detection data, including profile fitting, surface texture analysis, wear degree analysis, etc. It has ISO 17025 and NIST traceable calibration, ensuring that the detection data meets the requirements of international scientific research and high-precision testing. It also supports remote control and cloud data management, realizing the sharing of scientific research data.

Product specifications:

Measurement parameters: Supports more than 30 surface roughness parameters and 20+ contour parameters, including 3D surface roughness analysis, contour error analysis, etc. Measurement range: Ra 0-3000μm, Rz 0-20000μm, horizontal measurement range X axis 0-300mm, Y axis 0-200mm, vertical measurement range 0-50mm. Vertical resolution: 0.0001μm, measurement accuracy: ≤±0.1% of reading +0.002μm. Stylus parameters: Diamond material, multiple tip radii optional (0.5μm, 1μm, 1.5μm, 2μm, 5μm), tip angle 90°, stylus force adjustable (0.1-1.0mN). Display: 15.6-inch 4K IPS touch screen, resolution 3840×2160. Power supply: AC 100-240V 50/60Hz, built-in 5000mAh backup battery for data protection. Dimensions: 800mm (length) ×500mm (width) ×400mm (height), net weight 45kg. Operating temperature: 20℃±2℃, humidity 40%-60% RH. Data storage: Supports storage of 1 million sets of detection data, supports cloud synchronization. Interface: USB3.0, Ethernet, Wi-Fi 6. Automated stage: Motorized X/Y axis, positioning accuracy ±0.01mm.

Product application:

This laboratory-grade roughness profiler is mainly used in university laboratories, national key scientific research institutions, high-end semiconductor manufacturing, aerospace precision component processing, and new material research and development. It can be used to detect the surface quality of ultra-high-precision components such as semiconductor wafers, aerospace engine blades, new material surface coatings, and optical components. It can also be used in scientific research projects to conduct in-depth analysis of surface features, providing data support for the development of new materials and new processes. In addition, it can be used in the calibration of other testing equipment to ensure the accuracy of the entire testing system.