The core advantages of this device include a 50W rhodium target X-ray tube that delivers stable and adjustable excitation energy, ensuring consistent testing performance for different elements. The high-resolution SDD detector with ultra-low background noise enables detection of trace elements at the ppb level, meeting the most demanding testing standards. The fully automated sample stage allows precise positioning of samples, reducing manual operation errors and improving testing efficiency. The supporting professional analysis software supports multi-element quantitative analysis, quality control, and data statistical analysis, and can be seamlessly integrated with laboratory information management systems (LIMS).
The spectrometer has an adjustable excitation voltage ranging from 10 to 60kV and current from 0 to 200μA, with a maximum power of 50W. The SDD detector has a resolution of ≤130eV at 5.9keV, ensuring excellent spectral resolution. The sample chamber is equipped with a motorized sample stage with a positioning accuracy of 0.1 Millimeters, supporting automatic scanning of large-area samples. It complies with ASTM, ISO, and other international testing standards, and the built-in radiation protection system meets national radiation safety regulations. The device supports offline data storage and can generate standardized test reports with complete test parameters and analysis results.
This desktop XRF spectrometer is widely used in material science research, semiconductor impurity detection, mineral component analysis, ceramic raw material testing, alloy composition analysis, and environmental sample laboratory testing. It provides accurate and efficient testing support for academic research institutions, high-end manufacturing enterprises, and environmental protection departments, helping them obtain reliable component data for product development, quality control, and environmental monitoring.
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